The ToF-SIMS group at UCLouvain (responsible person: Arnaud Delcorte, firstname.lastname@example.org) is looking for a postdoc to work on nanomechanics with Ar cluster beams, a quite exciting project that started in 2017 by studying polymer glass transitions with backscattered Ar cluster fragments (https://link.springer.com/article/10.1007%2Fs13361-017-1840-7). The postdoc appointment is 16 to 18 months (mobility scheme), essentially experimental and with a possibility of simulations. The starting date is immediate. A short abstract of the research project can be found hereafter. More details can be provided on request.
CLUSTERPROBE: Large gas cluster fragmentation and backscattering as a local probe of the surface physical properties of organic materials
Polymer-based organic materials are often used in forms in which the mechanical properties of surfaces are paramount as in, e.g., thin functional films used in organic electronics, or in which surface mechanics is an important component of long-term use, such as in composite materials in the aeronautics or in coatings of environmentally-exposed parts. In this project, we propose to develop a novel methodology based on the impact of large noble gas cluster ions to probe the surface mechanical properties of polymers at the molecular level. This new method uses the modification of the distribution of backscattered cluster fragment ions (measurable in a state-of-the-art secondary ion mass spectrometer – SIMS) in relation with the change of surface structural and mechanical properties. With this new methodology, local physical properties of the surface should be within reach of ion beams in a 2D or 3D SIMS analysis, in addition to detailed chemical information.
PhD in Chemistry, Physics or Applied Sciences
Experience in Secondary Ion Mass Spectrometry and/or Ion Beam AnalysisLire la suite